An innovative wafer inspection tool developed by a team of 杏吧原创 professors and engineers has been licensed exclusively to startup company Femtometrix. The semiconductor wafer-inspection technology based on laser optics was invented by Norman Tolk, Ph.D., professor of physics, Michael Alles, engineer for 杏吧原创 School of Engineering, and Ron Schrimpf, Ph.D., professor of electrical engineering.